Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Identifying canonical and replicable multi-scale intrinsic connectivity networks in 100k+ resting-state fMRI datasets.

Human brain mapping·2023
Same author

Hypertriglyceridaemia-induced pancreatitis.

QJM : monthly journal of the Association of Physicians·2023
Same author

Scurvy.

QJM : monthly journal of the Association of Physicians·2022
Same author

Paget-Schroetter syndrome.

QJM : monthly journal of the Association of Physicians·2021
Same author

Non-episodic angioedema with eosinophilia after BNT162b2 mRNA COVID-19 vaccination.

QJM : monthly journal of the Association of Physicians·2021
Same author

Improving the depth resolution of STEM-ADF sectioning by 3D deconvolution.

Microscopy (Oxford, England)·2020

Related Experiment Video

Updated: May 21, 2026

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
09:49

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope

Published on: March 16, 2022

Voltage-center and coma-free alignment for high-resolution electron microscopy.

K Ishizuka1, K Shirota

  • 1Electron Wavefront Project, JRDC, c/o Toyo University, Kawagoe, Saitama 350, Japan.

Ultramicroscopy
|June 7, 2012
PubMed
Summary

This study introduces a new method for electron microscope alignment, achieving both coma-free and voltage-center alignment simultaneously. This overcomes previous limitations, improving imaging quality for off-axis applications.

Related Experiment Videos

Last Updated: May 21, 2026

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
09:49

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope

Published on: March 16, 2022

Area of Science:

  • Electron Microscopy
  • Optical Physics

Background:

  • Conventional coma-free alignment in electron microscopes sacrifices voltage-center alignment.
  • Both alignment procedures typically utilize the same beam deflectors above the objective lens, creating a conflict.

Purpose of the Study:

  • To overcome the conflict between coma-free and voltage-center alignment procedures.
  • To achieve both alignments simultaneously without compromising image quality.

Main Methods:

  • Implementation of the Yanaka et al. method for electron microscope alignment.
  • Utilizing beam deflectors above the objective lens for coma-free alignment.
  • Employing beam deflectors below the objective lens for subsequent voltage-center alignment.

Main Results:

  • Successfully achieved simultaneous voltage-center and coma-free alignment conditions.
  • Demonstrated the effectiveness of the method even for 6-microm off-axis imaging.
  • Showed that this method resolves the appreciable difference between voltage-center and coma-free directions.

Conclusions:

  • The proposed method effectively resolves the trade-off between coma-free and voltage-center alignment.
  • This technique enhances the precision and applicability of electron microscopy, particularly for off-axis imaging.
  • Enables routine coma-free alignment without sacrificing voltage-center alignment.