Biasing of Metal-Semiconductor Junctions
Metal-Semiconductor Junctions
MOS Capacitor
MOSFET: Enhancement Mode
Biasing of FET
Debye–Huckel–Onsager Conductance Equation
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Updated: May 21, 2026

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Hai Yang Peng1, Yong Feng Li, Wei Nan Lin
1Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371 Singapore.
Researchers controlled resistive switching modes in nickel oxide (NiO) by adjusting stoichiometry and defects. This breakthrough enables tunable nonvolatile memory and volatile threshold switching in a single device, impacting future memory technologies.
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