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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 21, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

Multilayer graphene-coated atomic force microscopy tips for molecular junctions.

Yugeng Wen¹, Jianyi Chen, Yunlong Guo

¹Beijing National Laboratory for Molecular Sciences, Institute of Chemistry, Chinese Academy of Sciences, 100190 Beijing, PR China.

Advanced Materials (Deerfield Beach, Fla.)

|June 13, 2012

Summary

This summary is machine-generated.

Multilayer graphene tips enable stable molecular junction formation for molecular electronics. Their low variance, durability, and simple production suggest viability for mass production.

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Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

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Last Updated: May 21, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Area of Science:

Materials Science
Nanotechnology
Condensed Matter Physics

Background:

Molecular electronics aims to utilize individual molecules for electronic devices.
Atomic Force Microscopy (AFM) is a key technique for probing and manipulating matter at the nanoscale.
Developing stable and reproducible molecular junctions is crucial for advancing molecular electronics.

Purpose of the Study:

To develop and characterize multilayer graphene tips for fabricating molecular junctions using conducting probe atomic force microscopy (CP-AFM).
To evaluate the performance and stability of molecular junctions formed with graphene tips.

Main Methods:

Fabrication of multilayer graphene tips for CP-AFM.
Formation of molecular junctions by contacting molecules with graphene tips.
Characterization of junction properties including variance, stability, and endurance.

Main Results:

Graphene tips demonstrated very small tip-to-tip variance in molecular junction formation.
The molecular junctions exhibited excellent operational stability and good endurance.
Long shelf-life of the graphene tips was observed.

Conclusions:

Multilayer graphene tips offer a promising platform for creating stable molecular electronic devices.
The high yield, simple processing, and excellent performance metrics suggest commercial viability for graphene tips in molecular electronics.
Graphene tips represent a significant advancement for reproducible molecular junction fabrication.