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Application of inverse analysis to determine the strain distribution with optoelectronic method insensitive to

Piotr Kisała1

  • 1Department of Electronics, Lublin University of Technology, 2012, 38A Nadbystrzycka Street, 20-618 Lublin, Poland. p.kisala@pollub.pl

Applied Optics
|June 15, 2012
PubMed

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