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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Li-Jun Lu1, Xiao-Yan Hu, Cui-Yuan Sheng
1Department of Fine Mechanical Engineering, Shanghai University, Shanghai, China. lulijun@shu.edu.cn
This study introduces a new method for analyzing aberrations in ultra-wide-angle and panoramic optical systems. The approach optimizes optical designs, improving performance for fish-eye and omnidirectional imaging systems.
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