Interference and Diffraction
Phase Contrast and Differential Interference Contrast Microscopy
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Qun Luo1, Linhai Huang, Naiting Gu
1Institute of Optics and Electronics, Chinese Academy of Sciences PO Box 350, Chengdu 610209, China. littlepuppet_luo@163.com
A new diffraction grating-based phase diversity wavefront sensor (G-PD WFS) overcomes CCD limitations. This enhanced sensor significantly improves wavefront aberration measurement accuracy, particularly for large amplitudes.
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