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Extracting infrared absolute reflectance from relative reflectance measurements
Susan L Berets1, Milan Milosevic
1Harrick Scientific Products, Pleasantville, New York 10570, USA. sberets@harricksci.com
Abstract:
Absolute reflectance measurements are valuable to the optics industry for development of new materials and optical coatings. Yet, absolute reflectance measurements are notoriously difficult to make. In this paper, we investigate the feasibility of extracting the absolute reflectance from a relative reflectance measurement using a reference material with known refractive index.
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