Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Imperfections in Crystal Structure: Point, Line and Plane Defects01:25

Imperfections in Crystal Structure: Point, Line and Plane Defects

A perfect crystal, in theory, has a uniform structure with the same unit cell and lattice points throughout. However, any deviation from this periodic arrangement is known as an imperfection or defect. These defects can be categorized into three types: point, line, and plane defects.Point defects occur when there is a deviation from the ideal due to missing atoms, displaced atoms, or additional atoms. These imperfections might occur due to imperfect packing during crystallization or because of...
Imperfections in Crystal Structure: Stoichiometric Point Defects01:26

Imperfections in Crystal Structure: Stoichiometric Point Defects

Schottky defects arise when some lattice points in a crystal, such as those in NaCl, remain unoccupied, creating lattice vacancies without disturbing the overall electrical neutrality of the crystal. This defect is common in ionic crystals where the positive and negative ions are similar in size, as seen in sodium chloride and cesium chloride. The presence of Schottky defects enables the crystal to conduct electricity to a small extent through an ionic mechanism. Electric fields cause nearby...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Public Health.

Alzheimer's & dementia : the journal of the Alzheimer's Association·2025
Same author

Social feedback amplifies emotional language in online video live chats.

Communications psychology·2025
Same author

InstantGroup: Instant Template Generation for Scalable Group of Brain MRI Registration.

IEEE transactions on image processing : a publication of the IEEE Signal Processing Society·2025
Same author

MiR-1 alleviates chronic heart failure through HCN2/HCN4 axis in vitro.

Tissue & cell·2025
Same author

Safety and efficacy of Angong Niuhuang Pills in patients with moderate-to-severe acute ischemic stroke (ANGONG TRIAL): A randomized double-blind placebo-controlled pilot clinical trial.

Chinese medical journal·2024
Same author

Depth-Aware Networks for Multi-Organ Lesion Detection in Chest CT Scans.

Bioengineering (Basel, Switzerland)·2024

Related Experiment Video

Updated: May 21, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
11:48

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Published on: April 24, 2018

Nonrigid image registration with crystal dislocation energy.

Yishan Luo1, Albert C S Chung

  • 1Lo Kwee-Seong Medical Image Analysis Laboratory, Department of Computer Science and Engineering, Hong Kong University of Science and Technology, Kowloon, Hong Kong. lisaluo@cse.ust.hk

IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society
|June 28, 2012
PubMed
Summary
This summary is machine-generated.

This study introduces a novel nonrigid image registration method using dislocation theory to align object boundaries. The new energy function improves accuracy and speed, outperforming state-of-the-art methods in brain image analysis.

More Related Videos

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Related Experiment Videos

Last Updated: May 21, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
11:48

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Published on: April 24, 2018

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Area of Science:

  • Medical image analysis
  • Computational physics
  • Computer vision

Background:

  • Nonrigid image registration aligns images by finding transformations to minimize differences.
  • Current methods often treat registration as an optimization problem minimizing an energy function.
  • Aligning object boundaries is a key challenge in image registration.

Purpose of the Study:

  • To develop a novel energy function for nonrigid image registration based on dislocation theory.
  • To improve registration accuracy, convergence rate, and enable symmetric transformations.
  • To compare the proposed method against state-of-the-art techniques like SyN.

Main Methods:

  • Image registration is framed as aligning object boundaries, viewed as dislocations in a crystal system.
  • A new registration energy function is derived from dislocation energy principles.
  • The energy function incorporates global gradient information, creating orientation-dependent, long-range interactions.
  • The method is adapted for symmetric diffeomorphic transformations for one-to-one matching.

Main Results:

  • The new energy function demonstrates fast convergence and high registration accuracy.
  • Theoretical proofs and experimental validation confirm the method's superiority.
  • Comparison with the SyN method on 3-D MRI brain images shows improved performance.
  • The proposed method achieves better registration accuracy and reduced computation time.

Conclusions:

  • The dislocation-based image registration framework offers significant advantages over existing methods.
  • The novel energy function provides an effective approach for accurate and efficient nonrigid image registration.
  • This method holds promise for applications in medical imaging and other fields requiring precise image alignment.