Determination of Crystal Structures
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
1Lo Kwee-Seong Medical Image Analysis Laboratory, Department of Computer Science and Engineering, Hong Kong University of Science and Technology, Kowloon, Hong Kong. lisaluo@cse.ust.hk
This study introduces a novel nonrigid image registration method using dislocation theory to align object boundaries. The new energy function improves accuracy and speed, outperforming state-of-the-art methods in brain image analysis.
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