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Updated: May 20, 2026

Improving High Viscosity Extrusion of Microcrystals for Time-resolved Serial Femtosecond Crystallography at X-ray Lasers
Published on: February 28, 2019
Synchrotron-based ultrafast x-ray diffraction at high repetition rates.
H Navirian1, R Shayduk, W Leitenberger
1Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Wilhelm-Conrad-Röntgen Campus, BESSY II, Albert-Einstein-Str. 15, 12489 Berlin, Germany.
This study details an ultrafast X-ray diffraction (UXRD) setup using high-repetition-rate lasers to probe material dynamics. Researchers achieved high precision in spatial overlap and lattice change measurements, enabling detailed analysis of transient phenomena.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Physical Chemistry
Background:
- Ultrafast X-ray Diffraction (UXRD) is crucial for studying dynamic processes in materials.
- High repetition rate experiments present challenges in heat-load management and precise spatio-temporal alignment.
Purpose of the Study:
- To present and validate a novel UXRD setup at BESSY II optimized for high repetition rates.
- To address challenges associated with high heat-load and achieve precise laser-sample-X-ray synchronization.
- To investigate transient lattice dynamics in laser-excited materials.
Main Methods:
- Utilized a pump laser delivering 250 fs pulses at repetition rates from 208 kHz to 1.25 MHz.
- Implemented strategies for managing high heat-load and achieving 10 μm spatial overlap precision.
- Performed time-resolved X-ray diffraction on a laser-excited LSMO/STO superlattice.
Main Results:
- Achieved high spatial overlap precision and recorded transient lattice changes with an accuracy of δa/a(0) = 10(-6).
- Compared experimental time-resolved X-ray diffraction signals with phonon dynamics simulations.
- Determined X-ray pulse durations of 120 ps in standard mode and <10 ps in low-α mode.
Conclusions:
- The developed UXRD setup is effective for high-repetition-rate studies of ultrafast material dynamics.
- The system enables precise characterization of transient lattice changes and phonon dynamics.
- Accurate determination of X-ray pulse durations is critical for interpreting time-resolved data.
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