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Updated: May 20, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

High-speed and high-sensitivity displacement measurement with phase-locked low-coherence interferometry.

Lazo M Manojlović¹, Miloš B Zivanov, Miloš P Slankamenac

¹Zrenjanin Technical College, Đorđa Stratimirovića 23, 23000 Zrenjanin, Serbia. lazo.manojlovic@vts‐zr.edu.rs

|July 10, 2012

Summary

A new fiber-optic sensing system achieves high-speed, high-sensitivity displacement measurements using phase-locked low-coherence interferometry. This novel approach significantly enhances measurement speed compared to existing methods.

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Implementation of a Reference Interferometer for Nanodetection

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A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

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Published on: September 30, 2019

Area of Science:

Optics and Photonics
Metrology
Fiber Optic Sensing

Background:

Phase-locked interferometry is crucial for precise displacement measurements.
Standard systems often face limitations in speed due to phase modulation and lock-in amplification.

Purpose of the Study:

To develop a novel high-speed and high-sensitivity displacement measurement sensing system.
To overcome the speed limitations of conventional phase-locked interferometric systems.

Main Methods:

Utilized a Michelson fiber-optic interferometer.
Employed a 3x3 fused silica fiber-optic directional coupler to obtain quadrature signals.
Avoided interferometer phase modulation and lock-in amplification.

Main Results:

Achieved significantly increased measurement speed compared to standard systems.
Demonstrated a bandwidth limited to 4.6 kHz by the piezo actuator's resonance frequency.
Estimated noise floor for displacement measurement is approximately 180 pm/√Hz.

Conclusions:

The developed system offers a substantial advancement in high-speed, high-sensitivity displacement sensing.
The novel method using a 3x3 coupler provides a faster alternative for interferometric measurements.
The system's performance metrics indicate its potential for advanced metrology applications.