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Updated: May 20, 2026
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Direct correlation between electric and structural properties during solidification of poly(3-hexylthiophene)
Linda Grodd1, Ullrich Pietsch, Souren Grigorian
1Department Physik, Universität Siegen, Walter-Flex-Straße 3, Siegen, Germany. grodd@physik.uni-siegen.de
Abstract:
Structural and electrical properties of semicrystalline P3HT cast films onto Si/SiO(2) surface are studied during the solidification under applied electric field in lateral OFET geometry. During evaporation of the solvent, the formation of P3HT crystallites is monitored simultaneously by time-resolved X-ray diffraction and by source-drain current measurements. The electrical current is reaching its maximum in two pronounced regimes already before complete solidification of the polymer as detected by X-ray diffraction intensities. The monitored complex time dependence of current and X-ray intensities reveals a highest conducting level for the gel-like state.
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