Near-field focused photoemission from polystyrene microspheres studied with photoemission electron microscopy

We use photoemission electron microscopy (PEEM) to image 3 μm diameter polystyrene spheres supported on a metal thin film illuminated by 400 nm (∼3.1 eV) and 800 nm (∼1.5 eV) femtosecond (fs) laser pulses. Intense photoemission is generated by microspheres even though polystyrene is an insulator and its ionization threshold is well above the photon energies employed. We observe intense photoemission from the far side (the side opposite the incident light) of the illuminated microsphere that is attributed to light focusing within the microsphere. For the case of p-polarized, 800 nm fs laser pulses, we observe photoemission exclusively from the far side of the microsphere and additionally resolve sub-50 nm hot spots in the supporting Pt∕Pd thin film that are located only within the focal region of the microsphere. We compare the PEEM images with finite difference time domain (FDTD) electrodynamic simulations to model our experimental results. The FDTD simulations predict light focusing in the microsphere and subsequent interaction with the supporting metal surface that is consistent with the experimental observations.