High performance surface-enhanced Raman scattering substrates of Si-based Au film developed by focused ion beam

Tingting Gao1, Zongwei Xu, Fengzhou Fang

  • 1State Key Laboratory of Precision Measuring Technology & Instruments, Centre of MicroNano Manufacturing Technology, Tianjin University, Tianjin 300072, China. fzfang@gmail.com.

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