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Polarization resolved reflection from ordered vertical silicon nanowire arrays
M Khorasaninejad1, N Abedzadeh, J Sun
1Department of Electrical and Computer Engineering, University of Waterloo, 200, University Avenue West, Waterloo, Ontario, Canada.
Optics Letters
|July 25, 2012
Abstract:
We measure polarization resolved reflections from ordered vertical silicon nanowire arrays of two different diameters and compare the results to rigorous coupled wave analysis simulations. Ellipsometric analysis based on anisotropic effective-medium approximation is used to fit the experimental data and estimate the diameter and length of the nanowires. In addition, depolarization of light is observed for wavelengths below 400 nm.
