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Related Concept Videos

Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
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There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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A multi-crystal wavelength dispersive x-ray spectrometer.

Roberto Alonso-Mori1, Jan Kern, Dimosthenis Sokaras

  • 1LCLS, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA.

The Review of Scientific Instruments
|August 3, 2012
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Summary

A new spectrometer enables high-resolution, time-resolved X-ray Emission Spectroscopy (XES) and X-ray Raman Scattering (XRS) studies. This powerful tool captures fast dynamics at X-ray Free Electron Lasers (XFELs) and synchrotrons.

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Area of Science:

  • Spectroscopy
  • Materials Science
  • Physical Chemistry

Background:

  • X-ray spectroscopy techniques like XES and XRS are crucial for material analysis.
  • Traditional methods often require time-consuming scans or lack the resolution for dynamic processes.
  • Studying fast phenomena requires instruments capable of high throughput and temporal resolution.

Purpose of the Study:

  • To introduce a novel multi-crystal wavelength dispersive hard x-ray spectrometer.
  • To enable time-resolved XES and XRS measurements with high energy resolution and large solid angle collection.
  • To facilitate the study of ultrafast dynamics in various systems, including photo-induced processes and catalytic reactions.

Main Methods:

  • The spectrometer utilizes the Von Hamos geometry for dispersive measurements.
  • It employs multiple crystals for enhanced spectral collection.
  • The design allows for single-shot spectral acquisition, eliminating the need for scanning.

Main Results:

  • The instrument achieves high energy resolution and large solid angle collection.
  • Single-shot spectral acquisition is demonstrated, enabling time-resolved measurements.
  • The spectrometer is suitable for use at X-ray Free Electron Lasers (XFELs) and synchrotron facilities.

Conclusions:

  • This spectrometer is a powerful tool for time-resolved XES and XRS studies.
  • It overcomes limitations of previous instruments, allowing investigation of dynamics from femtoseconds to milliseconds.
  • The technology opens new avenues for studying fast reactions and light-induced phenomena with reduced radiation damage concerns.