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Published on: September 30, 2022
Elemental and magnetic sensitive imaging using x-ray excited luminescence microscopy
R A Rosenberg1, S Zohar, D Keavney
1Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
The Review of Scientific Instruments
|August 3, 2012
Summary
X-ray excited luminescence microscopy offers full-field elemental and magnetic imaging. This technique utilizes a standard optical microscope with synchrotron radiation for advanced material analysis.
Area of Science:
- Materials Science
- Microscopy
- Synchrotron Radiation Physics
Background:
- Conventional synchrotron radiation imaging techniques have limitations in elemental and magnetic sensitivity.
- Developing advanced microscopy methods is crucial for detailed material characterization.
Purpose of the Study:
- To demonstrate the potential of x-ray excited luminescence microscopy for elemental and magnetic imaging.
- To adapt a commercial optical microscope for use with synchrotron radiation beamlines.
Main Methods:
- Utilizing a commercial optical microscope integrated with a synchrotron radiation beamline.
- Performing x-ray energy-dependent measurements on various material samples.
- Characterizing instrument resolution and performance limitations.
Main Results:
- Achieved a potential resolution of 1 μm, though practical limitations like vibrations affected performance.
- Obtained clear elemental and magnetic signatures from model solar cell materials.
- Successfully imaged lithographically patterned magnetic thin film structures.
Conclusions:
- X-ray excited luminescence microscopy is a viable technique for full-field elemental and magnetic imaging.
- The adapted optical microscope system shows promise for advanced material analysis at synchrotron facilities.
- Further improvements can enhance resolution and stability for routine applications.
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