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Related Concept Videos

X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Three-Dimensional Microscopy in Microbiology01:28

Three-Dimensional Microscopy in Microbiology

Three-dimensional imaging techniques are essential in cell biology, allowing researchers to visualize intricate cellular structures with high resolution. Two prominent methods, Differential Interference Contrast Microscopy (DIC) and Confocal Scanning Laser Microscopy (CSLM), provide distinct advantages for imaging live and thick specimens, respectively.Differential Interference Contrast MicroscopyDIC microscopy enhances contrast in transparent, unstained samples by converting phase...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 19, 2026

3D Imaging of Soft-Tissue Samples using an X-ray Specific Staining Method and Nanoscopic Computed Tomography
07:01

3D Imaging of Soft-Tissue Samples using an X-ray Specific Staining Method and Nanoscopic Computed Tomography

Published on: October 24, 2019

An instrument for 3D x-ray nano-imaging.

M Holler1, J Raabe, A Diaz

  • 1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. mirko.holler@psi.ch

The Review of Scientific Instruments
|August 3, 2012
PubMed
Summary

We developed a new 3D scanning X-ray microscopy instrument for high-resolution imaging. This advanced tool achieves nanoscale resolution, enabling detailed analysis of microstructures.

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3D Imaging of Soft-Tissue Samples using an X-ray Specific Staining Method and Nanoscopic Computed Tomography
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Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Advanced microscopy techniques are crucial for characterizing materials at the nanoscale.
  • Existing X-ray microscopy methods face limitations in resolution and 3D imaging capabilities.

Purpose of the Study:

  • To introduce a novel instrument for 3D scanning X-ray microscopy.
  • To demonstrate the instrument's capability for high-resolution imaging and analysis.

Main Methods:

  • Development of a 3D scanning X-ray microscopy instrument with precise sample positioning controlled by laser interferometry.
  • Utilizing scanning X-ray diffraction microscopy for performance assessment.
  • Employing a 3 μm pinhole for beam definition.

Main Results:

  • Achieved a position stability better than 10 nm standard deviation.
  • Demonstrated 18 nm resolution in 2D imaging of a lithographic test pattern.
  • Achieved 53 nm resolution in 3D imaging of copper interconnects in a microprocessor.

Conclusions:

  • The developed instrument significantly advances 3D scanning X-ray microscopy.
  • The high resolution achieved enables detailed nanoscale structural analysis.
  • This technology has potential applications in semiconductor research and materials characterization.