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Related Experiment Video

Updated: May 19, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Wavenumber scanning-based Fourier transform white-light interferometry.

Zhen Wang¹, Yi Jiang

¹School of Opto-Electronics, Beijing Institute of Technology, No. 5 Zhongguancun South Street, Haidian District, Beijing 100081, China.

|August 4, 2012

Summary

This summary is machine-generated.

A new wavenumber scanning method (k-method) improves optical path difference measurements in interferometry. This technique eliminates spectral chirp, significantly enhancing measurement accuracy compared to the traditional wavelength scanning method (λ-method).

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Area of Science:

Optical Metrology
Interferometry
Spectroscopy

Background:

Fourier transform white-light interferometry (FTWLI) measures optical path difference (OPD) by analyzing phase shifts across a scanned wavelength spectrum.
The conventional wavelength scanning method (λ-method) introduces spectral chirp, leading to deviations and reduced measurement accuracy.
Accurate OPD measurement is crucial for various applications, including precision engineering and scientific research.

Purpose of the Study:

To introduce and validate an improved interferometric measurement technique, the wavenumber scanning method (k-method).
To address the limitations of spectral chirp inherent in the λ-method.
To enhance the accuracy and reliability of OPD measurements in white-light interferometry.

Main Methods:

Development and experimental implementation of the wavenumber scanning method (k-method) for FTWLI.
Comparative analysis of measurement results obtained using the k-method and the traditional λ-method.
Interrogation of an extrinsic Fabry-Perot interferometer (EFPI) with a cavity length of 387 μm to assess performance.

Main Results:

The k-method eliminates the spectral chirp observed in the optical spectrum obtained via the λ-method.
Experimental comparison demonstrated a significant reduction in measurement deviation using the k-method.
The standard deviation of OPD measurements decreased from 0.015 μm to 0.004 μm when employing the k-method.

Conclusions:

The wavenumber scanning method (k-method) offers a superior alternative to the wavelength scanning method (λ-method) for FTWLI.
Eliminating spectral chirp through k-method significantly improves the accuracy of optical path difference measurements.
This advancement holds promise for applications requiring high-precision optical metrology.