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Updated: May 19, 2026
06:48
A Multimodal Wide-Field Fourier-Transform Raman Microscope
Published on: December 30, 2025
[Study on spectrum inversion of spatially modulated Fourier transform spectrometer]
Jin-Guang Lü1, Jing-Qiu Liang, Zhong-Zhu Liang
1State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China. jinguanglv@163.com
Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
|August 9, 2012
Summary
This study enhances static Fourier transform spectrometry by improving spatial domain sampling and interferogram correction techniques. Space-domain correction offers superior spectrum line shape accuracy, minimizing standard deviation for precise measurements.
Area of Science:
- Spectroscopy
- Optical Engineering
- Signal Processing
Context:
- Static Fourier transform spectrometers utilize spatial domain sampling.
- Interferogram images are captured as planar spatial arrays.
- Image segmentation and addressing location are key steps in data acquisition.
Purpose:
- To improve the sampling mode and interferogram correction in static Fourier transform spectrometry.
- To investigate frequency-domain spectrum correction and space-domain interferogram correction methods.
- To enhance the accuracy of spectrum line shape and reduce phase errors.
Summary:
- Spatial domain sampling is employed, with interferograms captured by stepped mirrors and detectors.
- The interferogram image is segmented into units for processing.
- Over-zero sampling and apodization techniques are applied to interferogram sequences.
- Both frequency-domain and space-domain correction methods were researched, with space-domain correction showing better performance.
- Simulation results demonstrate the effectiveness of space-domain correction, achieving a low spectrum standard deviation of 0.012 088.
Impact:
- Provides a more accurate method for spectrum analysis in Fourier transform spectrometry.
- The improved space-domain correction technique leads to enhanced spectrum line shape fidelity.
- Contributes to advancements in optical metrology and analytical instrumentation.
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