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X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

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Related Experiment Video

Updated: May 19, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
11:08

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

Published on: November 30, 2012

Enhanced backscattering for infrared detection using photonic crystal based flat lens.

Jonathan Oden1, Maxence Hofman, Xavier Mélique

  • 1Institut d’Electronique, de Microélectronique et de Nanotechnologie (IEMN), UMR CNRS 8520, Université des Sciences et Technologies de Lille, Villeneuve d’Ascq, France.

Applied Optics
|August 14, 2012
PubMed
Summary

This study demonstrates subwavelength infrared detection of micronic targets using a negative refractive index flat lens. The technology exploits backscattered waves and target eigenmode excitation for enhanced sensitivity, paving the way for novel noninvasive sensors.

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Last Updated: May 19, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
11:08

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

Published on: November 30, 2012

Infrared Degenerate Four-wave Mixing with Upconversion Detection for Quantitative Gas Sensing
10:42

Infrared Degenerate Four-wave Mixing with Upconversion Detection for Quantitative Gas Sensing

Published on: March 22, 2019

Area of Science:

  • Photonics and Semiconductor Technology
  • Infrared Sensing
  • Metamaterials

Background:

  • Photonic crystal semiconductor technology enables novel optical devices.
  • Negative refractive index materials offer unique wave manipulation properties.
  • Infrared detection is crucial for various sensing applications.

Purpose of the Study:

  • To evaluate an n=-1 flat lens for infrared detection.
  • To achieve subwavelength detection of micronic dielectric targets.
  • To explore the role of target properties and eigenmode excitation in detection efficiency.

Main Methods:

  • Utilizing a negative refractive index flat lens based on photonic crystal semiconductor technology.
  • Exploiting backscattered waves from a target in the lens's focal region.
  • Analyzing target eigenmode excitation (transverse, circular, longitudinal, whispering-gallery modes) and its effect on reflectivity.

Main Results:

  • Subwavelength detection of micronic dielectric targets at 1.55 μm was achieved.
  • Negative refraction and double focus of reflected waves were key to detection.
  • Detection efficiency is complexly related to target nature, shape, size, and eigenmode excitation.
  • Whispering-gallery modes significantly enhanced detection sensitivity.

Conclusions:

  • The n=-1 flat lens is effective for subwavelength infrared detection.
  • Understanding target eigenmode excitation is critical for optimizing sensor performance.
  • This research lays the groundwork for developing advanced, noninvasive infrared sensors.