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Related Experiment Video

Updated: May 19, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

Published on: June 16, 2014

Soft-landing preparative mass spectrometry.

Guido Verbeck¹, William Hoffmann, Barbara Walton

¹University of North Texas, 155 Union Circle, #305070, Denton, TX, USA. gverbeck@unt.edu

|August 18, 2012

Summary

This summary is machine-generated.

Soft-landing mass spectrometry isolates and deposits ions while preserving their structure. This review covers instruments and applications for studying ion-surface landing in hyperthermal and thermal energy regimes.

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Area of Science:

Analytical Chemistry
Physical Chemistry

Background:

Preparative mass spectrometry is a diverse field.
Soft-landing mass spectrometry offers ion isolation and deposition with preserved structural integrity.

Purpose of the Study:

To review instruments and applications for studying ion-surface landing in hyperthermal and thermal kinetic energy regimes.
To organize information based on instrumental considerations and molecular families.

Main Methods:

Focus on instruments and applications of ion-surface landing.
Exploration of hyperthermal and thermal kinetic energy regimes.
Review of various mass spectrometric ionization sources and instrumental configurations.

Main Results:

Soft-landing mass spectrometry preserves the structure-function relationship of molecules.
The technique is applicable to a broad range of molecular families.
Theoretical work is discussed at the end of the review.

Conclusions:

Soft-landing mass spectrometry is a valuable technique for ion isolation and deposition.
The review provides a comprehensive overview of the field, organized for readability.