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Updated: May 19, 2026

Orientational Transition in a Liquid Crystal Triggered by the Thermodynamic Growth of Interfacial Wetting Sheets

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Published on: May 15, 2017

Interfacial edge dislocation interactions with free-surfaces in nanocrystals.

A Kumar¹, K G Kavitha, A Subramaniam

¹Materials Science and Engineering, Indian Institute of Technology, Kanpur 208016, India.

Journal of Nanoscience and Nanotechnology

|August 22, 2012

Summary

The image force on edge dislocations is significantly altered in 2D nanocrystals and epitaxial systems. Standard theories inadequately predict these forces due to complex factors like misfit strains and domain deformations.

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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

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Published on: July 17, 2020

Area of Science:

Materials Science
Solid Mechanics
Nanotechnology

Background:

The image force describes dislocation interaction with free surfaces.
Standard models are insufficient for complex material systems.

Purpose of the Study:

Investigate altered image forces on edge dislocations.
Analyze interfacial misfit dislocations in epitaxial systems and 2D nanocrystals.

Main Methods:

Finite element modeling was employed.
Simulated epitaxial systems (Nb/Sapphire) and interfacial dislocations.
Imposed stress-free strains to model epitaxial conditions.

Main Results:

Image forces in 2D nanocrystals can be attractive, neutral, or repulsive, deviating from theoretical predictions.
Finite element models revealed significant alterations in image force magnitude and direction.
Standard theoretical formulations proved inadequate for these complex scenarios.

Conclusions:

Complex systems necessitate advanced modeling beyond standard image force theories.
Epitaxial strains and multi-material interfaces profoundly influence dislocation behavior.
Finite element method provides a robust approach for analyzing image forces in nanostructured and epitaxial materials.