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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Study on probe current dependence of the intensity distribution in annular dark field images

Suhyun Kim1, Yoshifumi Oshima, Yasumasa Tanishiro

  • 1Department of Physics, Tokyo Institute of Technology, 2-12-1, 1-24 Oh-okayama, Tokyo 152-8551, Japan. u98kim@surface.phys.titech.ac.jp

Ultramicroscopy
|September 1, 2012
PubMed

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