Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A Survey on Non-Autoregressive Generation for Neural Machine Translation and Beyond.

IEEE transactions on pattern analysis and machine intelligence·2023
Same author

Latent Tuberculosis Infection and Associated Factors in Patients with Systemic Lupus Erythematosus: a Multicenter, Cross-Sectional Study.

Microbiology spectrum·2023
Same author

The developmental toxicity of PM2.5 on the early stages of fetal lung with human lung bud tip progenitor organoids.

Environmental pollution (Barking, Essex : 1987)·2023
Same author

Toward accurate measurement of electromagnetic field by retrieving and refining the center position of non-uniform diffraction disks in Lorentz 4D-STEM.

Ultramicroscopy·2023
Same author

Autologous i-PRF promotes healing of radiation-induced skin injury.

Wound repair and regeneration : official publication of the Wound Healing Society [and] the European Tissue Repair Society·2023
Same author

Prenatal triclosan exposure impairs mammalian lung branching morphogenesis through activating Bmp4 signaling.

Ecotoxicology and environmental safety·2023

Related Experiment Video

Updated: May 19, 2026

Correlative Super-resolution and Electron Microscopy to Resolve Protein Localization in Zebrafish Retina
12:28

Correlative Super-resolution and Electron Microscopy to Resolve Protein Localization in Zebrafish Retina

Published on: November 10, 2017

Image simulation for atomic resolution secondary electron image.

Lijun Wu1, R F Egerton, Yimei Zhu

  • 1Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton NY 11973, USA.

Ultramicroscopy
|September 4, 2012
PubMed
Summary
This summary is machine-generated.

This study introduces a new simulation method for atomic resolution secondary electron (SE) and scanning transmission electron microscopy (STEM) images. The technique accurately models surface structure, aiding material analysis.

Related Experiment Videos

Last Updated: May 19, 2026

Correlative Super-resolution and Electron Microscopy to Resolve Protein Localization in Zebrafish Retina
12:28

Correlative Super-resolution and Electron Microscopy to Resolve Protein Localization in Zebrafish Retina

Published on: November 10, 2017

Area of Science:

  • Materials Science
  • Surface Science
  • Electron Microscopy

Background:

  • Atomic resolution secondary electron (SE) imaging in scanning transmission electron microscopy (STEM) has been recently achieved using aberration-corrected instruments.
  • SE imaging offers high sensitivity to surface structure, enabling simultaneous study of surface and bulk properties alongside annular dark-field (ADF) imaging.
  • Quantitative analysis of SE images requires accurate simulation methods to retrieve surface structure information.

Purpose of the Study:

  • To develop a novel method for simultaneously simulating atomic resolution SE and ADF-STEM images.
  • To provide a computational tool for quantitatively explaining SE image contrast and extracting surface structure details.
  • To validate the simulation method against experimental observations.

Main Methods:

  • Development of a simultaneous SE and ADF-STEM image calculation method.
  • Application of the multislice technique combined with a frozen-phonon approximation.
  • Incorporation of an object function for secondary electrons derived from inelastic scattering.
  • Calculation of secondary electron intensity distribution emitted from each slice.

Main Results:

  • The developed method successfully simulates both atomic resolution SE and ADF-STEM images concurrently.
  • SE image contrast was found to be sensitive to surface structure and electron inelastic mean free path.
  • SE image contrast showed insensitivity to specimen thickness for thicknesses greater than 5 nm.
  • Simulated SE images of SrTiO(3) crystal demonstrated strong agreement with experimental data.

Conclusions:

  • The new simulation method is effective for analyzing atomic resolution SE images in STEM.
  • The simulation provides a pathway for quantitative retrieval of surface structure information from SE imaging.
  • The findings support the utility of aberration-corrected STEM with SE imaging for advanced materials characterization.