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Area of Science:

  • Biophysics
  • Optical Microscopy
  • Nanotechnology

Background:

  • Photonic force microscopes (PFM) typically use quadrant position detectors for high-resolution position sensing.
  • Conventional methods using high numerical aperture (NA) objectives limit the linear response range of probe displacement to a few hundred nanometers.

Purpose of the Study:

  • To develop an improved position detection scheme for PFMs.
  • To extend the linear detection range for probe displacement beyond the conventional limits.
  • To achieve absolute and relative probe position measurements without reducing trapping force.

Main Methods:

  • Introduction of a low NA detection beam into the condenser.
  • Utilizing a pinhole with tunable size to control the detection spot.
  • Implementing a novel optical configuration for enhanced position detection.

Main Results:

  • Achieved a significantly widened linear detection range of several micrometers for probe displacement.
  • Demonstrated the ability to perform position detection without compromising the optical trap's trapping force.
  • Enabled simultaneous measurement of absolute and relative probe positions.

Conclusions:

  • The proposed method offers a substantial improvement in position detection capabilities for PFMs.
  • This technique facilitates experiments requiring extended linear range and precise position measurements.
  • The approach provides a versatile solution for advanced applications in nanomanipulation and biophysics.