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Updated: May 19, 2026

08:46
Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
3D multiscale segmentation and morphological analysis of X-ray microtomography from cold-sprayed coatings
L Gillibert1, C Peyrega, D Jeulin
1Centre de Morphologie Mathématique, Mathématiques et Sytèmes, Mines ParisTech, France. luc.gillibert@cmm.ensmp.fr
Journal of Microscopy
|September 6, 2012
Abstract:
X-ray microtomography from cold-sprayed coatings brings a new insight on this deposition process. A noise-tolerant segmentation algorithm is introduced, based on the combination of two segmentations: a deterministic multiscale segmentation and a stochastic segmentation. The stochastic approach uses random Poisson lines as markers. Results on a X-ray microtomographic image of aluminium particles are presented and validated.
