Experimental procedures to mitigate electron beam induced artifacts during in situ fluid imaging of nanomaterials

Taylor J Woehl1, Katherine L Jungjohann, James E Evans

  • 1Department of Chemical Engineering and Materials Science, University of California, Davis, Davis, CA 95616, USA. tjwoehl@ucdavis.edu

Ultramicroscopy
|September 7, 2012
PubMed