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Updated: Feb 12, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Surface microanalysis by reflection electron energy-loss spectroscopy

Z L Wang1

  • 1Cavendish Laboratory, Cambridge, England.

Journal of Electron Microscopy Technique
|January 1, 1990
PubMed

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