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Updated: May 18, 2026

Epitaxial Nanostructured α-Quartz Films on Silicon: From the Material to New Devices
Published on: October 6, 2020
Shaped crystal growth of langasite-type piezoelectric single crystals and their physical properties
Yuui Yokota1, Akira Yoshikawa, Yoshisuke Futami
1Tohoku University, Sendai, Japan. yokota@imr.tohoku.ac.jp
Abstract:
We have grown shape-controlled langasite-type crystals by the micro-pulling-down (μ-PD) method. Columnar shaped La(3)Ta(0.5)Ga(5.5)O(14) (LTG), Ca(3)NbGa(3)Si(2)O(14) (CNGS), Ca(3)TaGa(3)Si(2)O(14) (CTGS), Sr(3)NbGa(3)Si(2)O(14) (SNGS), and Sr(3)Ta- Ga(3)Si(2)O(14) (STGS) crystals were grown using a Pt-Rh crucible with a 3-mm-diameter columnar die at the bottom. All grown crystals showed high transparency except for the peripheral area and diameter of approximately 3 mm. The chemical phases at the central parts of the grown crystals were identified as a single phase of langasite-type structure and their lattice parameters were almost the same as those of crystals grown by the Czochralski (Cz) method; however, some impurity phases were observed in the peripheral area. In X-ray rocking curve measurements, the grown crystals indicated equivalent crystallinity to the crystal grown by the Cz method. The piezoelectric constant d(11) of the CNGS crystal was 3.98 pC/N; this value is well correlated with those of previous reports.
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