Scanning Electron Microscopy
Overview of Electron Microscopy
Preparation of Samples for Electron Microscopy
Transmission Electron Microscopy
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Michael Huth1, Fabrizio Porrati, Christian Schwalb
1Physikalisches Institut, Max-von-Laue-Str. 1, Goethe-Universität, 60438 Frankfurt am Main, Germany.
Focused electron beam induced deposition (FEBID) enables nanometer-scale fabrication of advanced materials. This technique is evolving for applications in charge transport, sensing, and multicomponent systems, with future potential in electron-controlled chemistry.
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