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Related Concept Videos

Carrier Transport01:21

Carrier Transport

The generation of electrical current in semiconductors is fundamentally driven by two mechanisms: drift and diffusion. These processes are essential for the functionality and performance of semiconductor-based devices.
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The drift of charge carriers is started by an external electric field (E). Charged particles, such as electrons and holes, experience an acceleration between collisions with lattice atoms. For electrons, this results in a drift velocity (vd) given by:
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Electron Carriers

Electron carriers can be thought of as electron shuttles. These compounds can easily accept electrons (i.e., be reduced) or lose them (i.e., be oxidized). They play an essential role in energy production because cellular respiration is contingent on the flow of electrons.
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Coulomb's Law

Experiments with electric charges have shown that if two objects each have an electric charge, they exert an electric force on each other. The magnitude of the force is linearly proportional to the net charge on each object and inversely proportional to the square of the distance between them. The direction of the force vector is along the imaginary line joining the two objects and is dictated by the signs of the charges involved.
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Finite Element Modelling of a Cellular Electric Microenvironment
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Charge carrier dynamics and interactions in electric force microscopy.

Swapna Lekkala1, Nikolas Hoepker, John A Marohn

  • 1Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA.

The Journal of Chemical Physics
|October 2, 2012
PubMed
Summary
This summary is machine-generated.

Electric force microscopy can probe electrical noise in organic semiconductors. Coulomb interactions significantly suppress this noise, contrary to simpler models.

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Area of Science:

  • Physics
  • Materials Science
  • Electrical Engineering

Background:

  • Electric force microscopy (EFM) uses a charged tip to detect electrical forces from a sample in vacuum.
  • EFM can potentially measure electrical noise from charge carriers in organic semiconductors.
  • Understanding this noise is crucial for developing advanced electronic devices.

Purpose of the Study:

  • To develop a theory for cantilever frequency fluctuations in EFM driven by charge carrier dynamics.
  • To investigate the role of carrier transport and interactions on electrical noise spectra.
  • To compare theoretical predictions with experimental EFM measurements.

Main Methods:

  • Classical electrodynamic calculations based on Maxwell's equations coupled with diffusive carrier transport.
  • Modeling cantilever frequency fluctuations due to coupled charge carrier and dielectric fluctuations.
  • Experimental EFM measurements on an organic field-effect transistor.

Main Results:

  • A theory connecting EFM frequency fluctuations to the Casimir-Lifshitz force was established.
  • Carrier transport and inter-carrier interactions were shown to significantly affect the noise spectrum.
  • Freely diffusing carrier models can overestimate noise by orders of magnitude due to neglecting interactions.

Conclusions:

  • Coulomb interactions play a critical role in suppressing electrical noise from charge carriers in organic semiconductors.
  • Experimental EFM data qualitatively support the theoretical findings on noise suppression.
  • This work provides a more accurate framework for interpreting EFM measurements of electrical noise.