Reflection-mode, confocal, tip-enhanced Raman spectroscopy system for scanning chemical microscopy of surfaces

R Ramos1, M J Gordon

  • 1Department of Chemical Engineering, University of California Santa Barbara, Santa Barbara, California 93106-5080, USA.

Summary

This study presents a new confocal Raman spectroscopy system for nanoscale chemical imaging. The instrument achieves 20 nm resolution on opaque surfaces, enabling detailed analysis of materials like silicon germanium nanowires.

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