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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

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Feasibility study for mega-electron-volt electron beam tomography.

U Hampel1, Y Bärtling, D Hoppe

  • 1Institute of Fluid Dynamics, Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstraße 400, 01328 Dresden, Germany.

The Review of Scientific Instruments
|October 2, 2012
PubMed
Summary
This summary is machine-generated.

This study explores fast electron beam computed tomography using a 1 MeV electron beam for imaging dense technical objects. Researchers demonstrated a feasible method for high-energy electron beam tomography, enabling penetration of challenging materials.

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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

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Last Updated: May 18, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
08:46

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Area of Science:

  • Physics
  • Materials Science
  • Imaging Technology

Background:

  • Electron beam tomography is valuable for studying rapid technical processes.
  • High-energy X-rays (hundreds of keV) are often needed for sufficient penetration of technical objects.
  • Existing methods may lack the energy required for certain dense materials.

Purpose of the Study:

  • To investigate the feasibility of fast electron beam computed tomography (EBCT) using a 1 MeV electron beam.
  • To assess the capability of high-energy electron beams for imaging dense technical objects.
  • To develop and test an experimental setup for 1 MeV EBCT.

Main Methods:

  • Utilized a 1 MeV electron beam generated by an electrostatic accelerator.
  • Employed an inverse fan-beam tomography approach.
  • Generated radiographic projections from a linearly moving X-ray source.
  • Obtained angular projections by rotating the object and used a single X-ray detector.

Main Results:

  • Successfully conducted a feasibility study for fast electron beam computed tomography at 1 MeV.
  • Demonstrated the generation of X-rays suitable for penetrating dense technical materials.
  • The experimental setup proved functional for acquiring projection data.

Conclusions:

  • Fast electron beam computed tomography with a 1 MeV electron beam is feasible for imaging dense technical objects.
  • This technique offers a potential solution for material penetration challenges in high-energy X-ray imaging.
  • The developed inverse fan-beam approach with a moving source and rotating object is viable.