Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Localized carbon deposition enables trimming of photonic integrated circuits.

Nature communications·2026
Same author

Nonvolatile photonic field-programmable coupler array.

Science advances·2026
Same author

Defining octave equivalence and a comparative approach to understanding its biological foundations.

Current anthropology·2026
Same author

Supernetwork-based efficient mapping of deep learning applications to mixed-precision hardware using model adaptation.

Nature communications·2026
Same author

Wide Angle Polarization-Independent 6-Bit Optical Modulator Using Phase Change Material.

Nano letters·2026
Same author

Graded phononic metamaterials based on scalable microfabrication and design.

Nature communications·2026

Related Experiment Video

Updated: May 18, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy.

Abu Sebastian1, Naveen Shamsudhin, Hugo Rothuizen

  • 1IBM Research-Zurich, 8803 Rüschlikon, Switzerland. ase@zurich.ibm.com

The Review of Scientific Instruments
|October 2, 2012
PubMed
Summary

New cantilevers with aluminum nitride (AlN) actuators and platinum silicide (PtSi) tips enable advanced multi-frequency atomic force microscopy. These novel devices demonstrate excellent dynamic performance for versatile imaging applications.

More Related Videos

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Related Experiment Videos

Last Updated: May 18, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Atomic Force Microscopy (AFM) is a high-resolution surface imaging technique.
  • Traditional AFM cantilevers have limitations in dynamic range and operational frequencies.
  • Developing novel cantilever designs is crucial for advancing AFM capabilities.

Purpose of the Study:

  • To design and fabricate novel cantilevers for multi-frequency atomic force microscopy.
  • To integrate aluminum nitride (AlN) actuators and conductive platinum silicide (PtSi) tips.
  • To investigate the dynamic behavior and imaging versatility of the developed cantilevers.

Main Methods:

  • Cantilever design and fabrication incorporating AlN actuators and PtSi tips.
  • Stepped-rectangular geometry optimization for enhanced dynamic response.
  • Finite-element simulations to model cantilever dynamics.
  • Experimental characterization and multi-frequency AFM imaging.

Main Results:

  • Successful fabrication of cantilevers with integrated AlN actuators and PtSi tips.
  • Demonstrated excellent dynamic behavior and wide operational frequency range.
  • Validation of cantilever performance through various imaging experiments.
  • Showcased versatility for multi-frequency AFM applications.

Conclusions:

  • The developed cantilevers offer significant improvements for multi-frequency AFM.
  • Integrated AlN actuators and PtSi tips provide efficient actuation and sensing.
  • The stepped-rectangular geometry enhances dynamic performance.
  • These cantilevers are highly effective for diverse AFM imaging tasks.