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How to optically count graphene layers.

Sosan Cheon¹, Kenneth David Kihm, Jae Sung Park

¹World Class University Program, Seoul National University, Seoul, South Korea.

|October 9, 2012

Summary

Researchers developed a nonintrusive method to count graphene layers. By analyzing surface plasmon resonance (SPR) angle shifts, the number of stacked graphene layers can be reliably determined in real-time.

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Graphene's unique properties are layer-dependent.
Accurate characterization of graphene layers is crucial for its applications.
Nonintrusive and real-time methods for layer counting are highly desirable.

Purpose of the Study:

To establish a correlation between surface plasmon resonance (SPR) angle shift and the number of graphene layers.
To demonstrate a nonintrusive, real-time method for counting graphene layers.
To validate the method using synthesized multilayer graphene samples.

Main Methods:

Synthesis of single-layer graphene (SLG) via chemical vapor deposition.
Physical transfer of SLG onto a 48 nm gold film to create multilayer samples (1, 3, and 5 layers).

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Measurement of surface plasmon resonance (SPR) reflectance and angle shifts.

Main Results:

A clear correlation was observed between the SPR angle shift and the number of graphene layers.
The SPR angle shift and reflectance curve profiles successfully distinguished between samples with different numbers of graphene layers.
The method proved to be nonintrusive and capable of real-time monitoring.

Conclusions:

The SPR angle shift serves as a reliable indicator for counting graphene layers.
This technique offers a practical approach for real-time, nonintrusive characterization of multilayer graphene.
The findings facilitate the precise fabrication and application of graphene-based devices.