Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Early versus Late starting of Direct Oral Anticoagulants after breakthrough ischemic stroke: A Target Trial Analysis from the ASPERA-R Study.

International journal of stroke : official journal of the International Stroke Society·2026
Same author

Long-Term Outcome of Molecularly Defined Oligodendrogliomas: Comparison of Grade 2 and 3 Tumors.

Neurology·2026
Same author

A Multipurpose Study of BaZrS<sub>3</sub> and BaHfS<sub>3</sub>: Absolute Entropies, Thermal Decomposition, and Prediction of Intrinsic and Extrinsic Thermodynamic Stability.

The journal of physical chemistry. C, Nanomaterials and interfaces·2026
Same author

Anesthesia and medical cannabis: an integrated approach.

Minerva anestesiologica·2026
Same author

Paired transcriptomics of glioblastoma peripheral and core areas reveals CNTN2 as a potential therapeutic target.

Cancer letters·2026
Same author

Clinical benefit and predictors of response to momelotinib after ruxolitinib failure: A cooperative real-world study.

Cancer·2026

Related Experiment Video

Updated: May 17, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques.

Daniele Passeri1, Marco Rossi, Emanuela Tamburri

  • 1Department of Basic and Applied Sciences for Engineering, University of Rome Sapienza, Rome, Italy. daniele.passeri@uniroma1.it

Analytical and Bioanalytical Chemistry
|October 12, 2012
PubMed
Summary

Assessing the nanomechanical properties of polymeric thin films is crucial for nanotechnology applications. This review highlights Atomic Force Microscopy (AFM) techniques for characterizing these properties non-destructively.

More Related Videos

Micro-Mechanical Characterization of Lung Tissue Using Atomic Force Microscopy
11:10

Micro-Mechanical Characterization of Lung Tissue Using Atomic Force Microscopy

Published on: August 28, 2011

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Related Experiment Videos

Last Updated: May 17, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Micro-Mechanical Characterization of Lung Tissue Using Atomic Force Microscopy
11:10

Micro-Mechanical Characterization of Lung Tissue Using Atomic Force Microscopy

Published on: August 28, 2011

Quantitative Hardness Measurement by Instrumented AFM-indentation
08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Area of Science:

  • Materials Science
  • Nanotechnology
  • Polymer Science

Background:

  • Polymeric thin films are increasingly important in nanotechnology.
  • Their nanomechanical properties differ significantly from bulk materials.
  • Accurate characterization is essential for reliable applications.

Purpose of the Study:

  • To review state-of-the-art Atomic Force Microscopy (AFM) methods.
  • To assess AFM-based techniques for characterizing polymeric thin film mechanical properties.
  • To illustrate the merits and limitations of these AFM techniques.

Main Methods:

  • Focus on Atomic Force Microscopy (AFM) based techniques.
  • Review methods for in situ, non-destructive characterization.
  • Discuss techniques for qualitative and quantitative measurements and imaging.

Main Results:

  • AFM offers versatile tools for probing nanomechanical properties.
  • Methods allow for single-point measurements and property mapping.
  • Techniques provide nanometer lateral resolution for heterogeneous films.

Conclusions:

  • AFM-based methods are well-suited for characterizing polymeric thin films.
  • These techniques address the need for non-destructive, high-resolution mechanical property assessment.
  • Understanding limitations is key for effective application of AFM in polymer nanotechnology.