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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
Communication: Imaging the indirect dissociation dynamics of temporary negative ion: N2O- → N2 + O-
1Hefei National Laboratory for Physical Sciences at the Microscale and Department of Chemical Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, China.
Abstract:
We reported an imaging study of the dissociation dynamics of temporary negative ion N(2)O(-) formed in the low-energy electron attachment, e(-) + N(2)O → N(2)O(-) → N(2) + O(-). With the help of ab initio molecular dynamics calculations, the evolution of momentum distributions of the O(-) fragment in terms of the electron attachment energy is identified as the result of a competition between two distinctly different indirect pathways, namely, climbing over and bypassing the energy ridge after the molecular structure bending. These two pathways prefer leaving the N(2) fragment at the high vibrational and rotational states, respectively.
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