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Scanning tunneling microscopy of interface properties of Bi2Se3 on FeSe

Yilin Wang1, Yeping Jiang, Mu Chen

  • 1State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|November 1, 2012
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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