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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission

J Szlachetko1, M Nachtegaal, E de Boni

  • 1Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. jakub.szlachetko@psi.ch

The Review of Scientific Instruments
|November 7, 2012
PubMed

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