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Thermal imaging diagnostics of high-current electron beams
A Pushkarev1, G Kholodnaya, R Sazonov
1Tomsk Polytechnic University, 30 Lenin Ave., Tomsk, 634050, Russia. aipush@mail.ru
The Review of Scientific Instruments
|November 7, 2012
Summary
Thermal imaging diagnostics effectively measure pulsed electron beam energy density. This non-consumable method offers precise control over electron energy spectra and beam distribution, unlike traditional dosimetric approaches.
Area of Science:
- Physics
- Materials Science
- Engineering
Background:
- Pulsed electron beams are crucial in various scientific and industrial applications.
- Accurate measurement of electron beam parameters like energy density and spatial distribution is essential for process control and research.
- Existing methods, such as using radiosensitive materials, can be costly and time-consuming.
Purpose of the Study:
- To present a novel thermal imaging diagnostics system for measuring pulsed electron beam energy density.
- To demonstrate the system's capability in controlling electron energy spectrum and measuring beam cross-section density distribution.
- To evaluate the system's performance and compare it with existing methods.
Main Methods:
- Utilizing a thermal imager (Fluke-Ti10) to register the thermal print of a pulsed electron beam on a material with low bulk density and low thermal conductivity.
- Conducting tests on a pulsed electron accelerator (TEU-500) with electron energies of 300-500 keV and current densities of 0.1-0.4 kA/cm².
- Analyzing the thermal print to determine electron energy spectrum, spatial distribution, and total energy.
Main Results:
- The thermal imaging diagnostics successfully registered the heat pattern of the pulsed electron beam within a single pulse.
- Sensitivity was sufficient to detect energy densities over 0.1 J/cm² (or current densities over 10 A/cm² at 400 keV, 60 ns pulse duration).
- Achieved spatial resolution of 0.9-1 mm, providing detailed beam profile information.
Conclusions:
- Thermal imaging diagnostics provide a viable, cost-effective alternative for measuring pulsed electron beam characteristics.
- The method eliminates the need for expensive consumables and extensive processing time associated with dosimetric materials.
- This technique offers precise control and measurement of electron beam parameters, enhancing experimental accuracy and efficiency.
