Related Experiment Video
Updated: May 17, 2026

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
Published on: June 9, 2016
Tip preparation for near-field ablation at mid-infrared wavelengths
Joan A Hoffmann1, Benjamin Gamari, Deepa Raghu
1Department of Physics, The George Washington University, Washington, DC 20052, USA.
Abstract:
A fabrication method for high-throughput, fiber-based tips for near-field scanning microscopy (NSOM) in the mid-infrared (λ ~ 3 μm) has been developed. Several fiber materials have been investigated and recipes for wet-chemical etching have been varied to produce tips that are physically robust and are capable of low-loss transmission of high-power pulses of mid-infrared light. Ultimately, wet-chemical etching techniques are used on glass fibers to produce tips capable of focusing mid-infrared light to ablate material from sub-micron-sized regions of organic films. The power throughput of the tips is significantly increased by using a novel material, previously unreported for NSOM applications: germanate fibers. The tips produced are mechanically strong and capable of transmitting high light fluence without sustaining physical damage. Here, the development of these tips and their performance are described.
More Related Videos
11:47Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
Published on: February 27, 2013
12:27Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging
Published on: November 25, 2009