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Pinned, optically aligned diagnostic dock for use on the Z facility
M R Gomez1, G A Rochau, J E Bailey
1Sandia National Labs, Albuquerque, New Mexico 87185, USA. mrgomez@sandia.gov
The Review of Scientific Instruments
|November 7, 2012
Summary
The pinned optically aligned diagnostic dock (PODD) offers a versatile platform for measuring X-ray emission on the Z facility. Its modular design and off-line setup capabilities significantly improve diagnostic turnaround time and efficiency.
Area of Science:
- Plasma physics
- X-ray diagnostics
- High-energy density science
Background:
- The Z facility requires advanced diagnostics for X-ray emission measurement.
- Existing diagnostic systems can be time-consuming to set up and reconfigure.
Purpose of the Study:
- To introduce the Pinned Optically Aligned Diagnostic Dock (PODD) as a novel diagnostic platform.
- To highlight the PODD's versatility, modularity, and improved operational efficiency for the Z facility.
Main Methods:
- The PODD system utilizes precision-machined pins for optical alignment of diagnostic components.
- It houses modular Plasma Emission Acquisition (PEA) systems capable of supporting diverse configurations.
- Fielded configurations include various crystal spectrometers; proposed configurations include imagers and detector arrays.
Main Results:
- The PODD system demonstrates modularity, accommodating multiple diagnostic types (e.g., crystal spectrometers).
- Off-line setup and refined alignment procedures reduce machine turnaround time.
- Example data collected with the PODD are presented, validating its performance.
Conclusions:
- The PODD platform enhances the flexibility of X-ray emission measurements on the Z facility.
- Its design significantly improves diagnostic setup efficiency and reduces operational downtime.
- The PODD represents a substantial advancement over previous diagnostic instrumentation.
