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Updated: May 17, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Transmission crystal x-ray spectrometer covering the 6 keV-18 keV energy range with E∕ΔE = 1800 instrumental
John Seely1, Uri Feldman, Charles Brown
1Artep Inc., 2922 Excelsior Springs Court, Ellicott City, Maryland 21042, USA. seelyjf@gmail.com
Abstract:
A high-resolution x-ray spectrometer utilizing a thin quartz transmission crystal and covering the 6 keV-18 keV energy range has been developed and tested. The spectrometer consists of a cylindrically bent crystal in a vacuum housing. The crystal position and the range of Bragg angles that are incident on the crystal can be adjusted to record an ≈4 keV wide spectrum in the 6 keV-18 keV range. The spectrometer is of the Cauchois type and has a compact linear geometry that is convenient for deployment at laser-produced plasma, EBIT, and other x-ray sources. Test spectra of the W L and Mo K lines from laboratory sources have linewidths as small as 11 eV, approaching the natural widths, and instrumental resolving power as high as 1800. Techniques for enhancing the energy resolution are experimentally demonstrated.
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