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Updated: May 17, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Methods for characterizing x-ray detectors for use at the National Ignition Facility
S F Khan1, L R Benedetti, D R Hargrove
1Lawrence Livermore National Laboratory, Livermore, California 94550, USA. khan9@llnl.gov
Abstract:
Gated and streaked x-ray detectors generally require corrections in order to counteract instrumental effects in the data. The method of correcting for gain variations in gated cameras fielded at National Ignition Facility (NIF) is described. Four techniques for characterizing the gated x-ray detectors are described. The current principal method of characterizing x-ray instruments is the production of controlled x-ray emission by laser-generated plasmas as a dedicated shot at the NIF. A recently commissioned pulsed x-ray source has the potential to replace the other characterization systems. This x-ray source features a pulsed power source consisting of a Marx generator, capacitor bank that is charged in series and discharged in parallel, producing up to 300 kV. The pulsed x-ray source initially suffered from a large jitter (∼60 ns), but the recent addition of a pulsed laser to trigger the spark gap has reduced the jitter to ∼5 ns. Initial results show that this tool is a promising alternative to the other flat fielding techniques.
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