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Updated: May 17, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
J Zajac1, J Preinhaelter, J Urban
1Institute of Plasma Physics AS CR, vvi, Association EURATOM∕IPP.CR, Prague, Czech Republic. zajac@ipp.cas.cz
Electron Bernstein waves (EBWs) in COMPASS tokamak plasmas are observed via O and X mode cutoff. Angular scans reveal reflections influence emission, and low temperatures cause damping, explaining lower radiative temperatures than electron temperatures.
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