Related Experiment Video
Updated: May 17, 2026
High-resolution Thermal Micro-imaging Using Europium Chelate Luminescent Coatings
Published on: April 16, 2017
Near-field self-induced hollow spot through localized heating of polycarbonate/ZnS stack layer
Alberto da Costa Assafrao1, Arthur J H Wachters, Silvania F Pereira
1Optics Research Group, Department of Imaging Science and Technology, Delft University of Technology, The Netherlands. a.dacostaassafrao@tudelft.nl
Abstract:
We have found an alternative way of achieving a doughnutlike focused spot by simply melting a subwavelength scatterer in a polycarbonate/ZnS sample. The near-field microscopy technique is used to directly measure the induced doughnut spot in the near-field regime. A numerical model based on rigorous solution of the Maxwell's equations is proposed to study the phenomena. The simulations help to understand the optical mechanism behind the spot formation.
