Theory of Metallic Conduction
Electrical Conductivity
Metal-Semiconductor Junctions
Boundary Conditions for Current Density
Resistivity
Fermi Level Dynamics
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
David J Oliver1, Jesse Maassen, Mehdi El Ouali
1Department of Physics, McGill University, Montreal, QC, Canada H3A2T8. oliverd@physics.mcgill.ca
Electrical nanocontacts between gold and tungsten show reduced conduction due to electronic structure mismatch and mechanical defects. This impacts nanoelectronic device design and resistance.
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