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Published on: May 13, 2020
Substituent variation drives metal/monolayer/semiconductor junctions from strongly rectifying to ohmic behavior
Abd-Elrazek Haj-Yahia1, Omer Yaffe, Tatyana Bendikov
1Department of Materials and Interfaces, Weizmann Institute of Science, Rehovot, Israel.
Altering a substituent in Hg/X-styrene-Si junctions dramatically enhances current by eight orders of magnitude. This molecular effect controls silicon Schottky junction properties, impacting interface band alignment and sensing applications.
Area of Science:
- Materials Science
- Surface Science
- Semiconductor Physics
Background:
- Schottky junctions are critical in semiconductor devices.
- Interface states significantly affect junction performance.
- Molecular engineering offers a route to tune electronic properties.
Purpose of the Study:
- To investigate the impact of molecular substituents on Hg/styrene-Si junction characteristics.
- To demonstrate control over Schottky junction behavior via molecular modification.
- To explore the potential for molecular effects in interface engineering.
Main Methods:
- Fabrication of Hg/X-styrene-Si junctions with varying substituents (X).
- Electrical characterization of current-voltage (I-V) behavior.
- Analysis of interface state passivation and junction properties.
Main Results:
- An eight-orders of magnitude enhancement in junction current was observed by changing the substituent X.
- Interface states were passivated, leading to improved junction quality.
- The Si Schottky junction behavior was tunable from Ohmic to strongly rectifying based on the substituent.
Conclusions:
- A powerful electrostatic molecular effect significantly influences Hg/styrene-Si junction properties.
- Molecular substituents provide precise control over interface band alignment.
- This approach has direct applications in developing advanced sensors and electronic devices.
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