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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Atomic Emission Spectroscopy: Instrumentation01:22

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Related Experiment Video

Updated: May 16, 2026

In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis
14:53

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Published on: February 3, 2018

Mean atomic number quantitative assessment in backscattered electron imaging.

E Sánchez1, M Torres Deluigi, G Castellano

  • 1INQUISAL, Universidad Nacional de San Luis, San Luis, Argentina. gcas@famaf.unc.edu.ar

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|November 21, 2012
PubMed
Summary
This summary is machine-generated.

A new method quantifies mean atomic number (Z) using scanning electron microscopy. This technique analyzes backscattered electron signals to create accurate Z-maps for diverse materials.

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Area of Science:

  • Materials Science
  • Microscopy
  • Physics

Background:

  • Quantitative analysis of materials using electron microscopy is crucial.
  • Determining the mean atomic number (Z) provides insights into material composition.
  • Existing methods may have limitations in accuracy or applicability.

Purpose of the Study:

  • To develop a novel, quantitative method for obtaining mean atomic number (Z) images.
  • To establish a reliable technique for analyzing various sample types using scanning electron microscopy.
  • To validate the accuracy and reproducibility of the developed Z-mapping method.

Main Methods:

  • Utilizing the monotonically increasing relationship between backscattered electron signal and mean atomic number (Z).
  • Employing Monte Carlo simulations to fit an exponential function for gray level to Z conversion.
  • Acquiring backscattered electron images from metal and mineral standards for validation.

Main Results:

  • Successfully developed a method to generate quantitative mean atomic number (Z) images.
  • Demonstrated the reproducibility of Z determination using standard materials.
  • Applied the method to an unknown rock sample, comparing results with X-ray spectra analysis.

Conclusions:

  • The developed method provides accurate and reproducible quantitative mean atomic number (Z) imaging.
  • This technique is applicable to a wide range of unknown samples under controlled experimental conditions.
  • The findings offer a valuable tool for material characterization in scanning electron microscopy.