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Fabrication of High Contrast Gratings for the Spectrum Splitting Dispersive Element in a Concentrated Photovoltaic System
Published on: July 18, 2015
Multilayer porous silicon diffraction gratings operating in the infrared
Meifang Lai1, Gayathri M Sridharan, Giacinta Parish
1School of Mechanical and Chemical Engineering, University of Western Australia, 35 Stirling Hwy, Crawley, Western Australia, 6009, Australia. adrian.keating@uwa.edu.au.
Nanoscale Research Letters
|November 27, 2012
Summary
Researchers developed novel porous silicon diffraction gratings for 1,565 nm operation. These gratings show high transmission and potential for sensitive refractive index sensing applications.
Area of Science:
- Materials Science
- Optoelectronics
- Nanotechnology
Background:
- Porous silicon (PS) offers tunable optical properties.
- Diffraction gratings are crucial optical components.
- Developing efficient gratings for telecommunication wavelengths is important.
Purpose of the Study:
- To model, fabricate, and test transmission diffraction gratings at 1,565 nm using multilayer porous silicon films.
- To investigate the patterning capabilities and sensing potential of these novel gratings.
Main Methods:
- Modeling of diffraction gratings.
- Fabrication using photolithography and dry etching.
- Characterization of multilayer porous silicon films.
- Optical transmission measurements.
- Solvent vapor sensing experiments.
Main Results:
- Successful patterning of features down to 2 μm in submicron-thick mesoporous films.
- Achieved high transmission greater than 40%.
- Modeling indicated a potential 1 dB change in diffraction efficiency for a 1% change in refractive index.
- Demonstrated significant signal change in response to solvent vapor, aligning with models.
Conclusions:
- Multilayer porous silicon films are suitable for fabricating efficient transmission diffraction gratings.
- These gratings exhibit promising sensitivity for refractive index sensing applications.
- The developed fabrication techniques allow for precise feature control in mesoporous films.
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